Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
We have varied the disorder in a two-dimensional electron system in silicon by applying substrate bias. When the disorder becomes sufficiently low, we observe the emergence of the metallic phase, and find evidence for a metal-insulator transition (MIT): the single-parameter scaling of conductivity with temperature near a critical electron density. We obtain the scaling function β, which determines the length (or temperature) dependence of the conductance, β is smooth and monotonie, and linear in the logarithm of the conductance near the MIT, in agreement with the scaling theory for interacting systems. © 1998 Elsevier Science B.V. All rights reserved.
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Mark W. Dowley
Solid State Communications
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
T.N. Morgan
Semiconductor Science and Technology