Conference paper
Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
The Lorenz-polarization (LP) factor, which is used for X-ray intensity calculations from polycrystalline materials, contains a term that describes the fraction of diffracting grains in the irradiated sample volume. We present extensions of this term and a series of experiments that tests its applicability. The implications of the analysis on microbeam diffraction are also discussed. © 2004 International Centre for Diffraction Data.
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Frank Stem
C R C Critical Reviews in Solid State Sciences
Peter J. Price
Surface Science
J.A. Barker, D. Henderson, et al.
Molecular Physics