William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
The Lorenz-polarization (LP) factor, which is used for X-ray intensity calculations from polycrystalline materials, contains a term that describes the fraction of diffracting grains in the irradiated sample volume. We present extensions of this term and a series of experiments that tests its applicability. The implications of the analysis on microbeam diffraction are also discussed. © 2004 International Centre for Diffraction Data.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications