Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
We report a spectroscopic method for precisely measuring the effects of very small energy-shifting perturbations such as the Stark effect, with subhomogeneous-linewidth resolution. This method combines the conventional 2-pulse photon echo or stimulated photon echo with an interferometric technique based on the manipulation of the optical phase of an absorbing species with the perturbing field. This is illustrated by the Stark effect on the 7F5D0 transition of Eu3+, where we measure a Stark coefficient of 33.7 kHz/V cm-1 with a resolution of 1.9 kHz. © 1992 The American Physical Society.
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
J.H. Stathis, R. Bolam, et al.
INFOS 2005
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting