Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
To get accurate values of the London penetration depths in YBa2Cu3Ox, μSR measurements were performed on a high quality, sintered sample and a c-axis-oriented polycrystal. For the sintered sample the temperature dependence of the effective penetration depth λeff is well described by the two-fluid model, with λeff(0) = 155(10) nm. This behavior of λeff(T) is consistent with conventional s-wave pairing. The anisotropy ratio λc λab {reversed tilde equals} 5(1) was determined from measurements on the polycrystal. These results were used to calculate λab(0) = 130(10) nm and λc(0) {reversed tilde equals} 500 - 800 nm. © 1989.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
P.C. Pattnaik, D.M. Newns
Physical Review B