Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
To get accurate values of the London penetration depths in YBa2Cu3Ox, μSR measurements were performed on a high quality, sintered sample and a c-axis-oriented polycrystal. For the sintered sample the temperature dependence of the effective penetration depth λeff is well described by the two-fluid model, with λeff(0) = 155(10) nm. This behavior of λeff(T) is consistent with conventional s-wave pairing. The anisotropy ratio λc λab {reversed tilde equals} 5(1) was determined from measurements on the polycrystal. These results were used to calculate λab(0) = 130(10) nm and λc(0) {reversed tilde equals} 500 - 800 nm. © 1989.
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS