Conference paper
RF components implemented in an analog SiGe bipolar technology
J.N. Burghartz, M. Soyuer, et al.
BCTM 1996
The measurement of the accumulated phase error of phase-locked loops (PLLs) in microprocessor systems is discussed. A system which creates controlled power supply noise and measures the PLL response is described. Examples of the use of this technique are shown for a PLL used in a 400MHz microprocessor.
J.N. Burghartz, M. Soyuer, et al.
BCTM 1996
S.J. Koester, R. Hammond, et al.
IEEE Electron Device Letters
K. Rim, R. Anderson, et al.
Solid-State Electronics
Keith A. Jenkins, Y. Taur, et al.
IEEE International SOI Conference 1996