Ram Chillarege, Nicholas S. Bowen
FTCS 1989
The failure rate of widely distributed software products as a function of severity, release and time is reported. The measurement technique develops a direct link between failures and faults, providing an opportunity to study and describe the failure process. Two metrics, the fault weight, corresponding to the number of failures due to a fault, and the failure window, measuring the length of time between the first and last fault, are defined and characterized.
Ram Chillarege, Nicholas S. Bowen
FTCS 1989
S. Biyani, P. Santhanam
ISSRE 1998
Jarir K. Chaar, Michael J. Halliday, et al.
IEEE ITC 1993
Mark Sullivan, Ram Chillarege
FTCS 1992