William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
No abstract available.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
David Cash, Dennis Hofheinz, et al.
Journal of Cryptology
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990