S.L. Shindé, J. Morrill, et al.
Physical Review B
The CrO2 thin films epitaxially on TiO2(100) and Al2O3(0001) substrates were successively grown. The films have been structurally characterized using ex situ RHEED, X-ray diffraction and ion channeling spectroscopy. A Curie temperature of around 393 K is observed for the films, with those grown on TiO2 exhibiting a large magneto-crystalline anisotropy. Transport measurements show that films on TiO2 have a resistivity drop of about two orders upon cooling down from room temperature to 5 K.
S.L. Shindé, J. Morrill, et al.
Physical Review B
T.R. McGuire, S.A. Shivashankar, et al.
Journal of Applied Physics
Y. Ji, G.J. Strijkers, et al.
Physical Review Letters
B.W. Hussey, A. Gupta, et al.
Journal of Applied Physics