S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
The magnetization measurement on the nanometer scale was discussed. The magnetic tip of a magnetic force microscope within the point-probe approximation was calibrated. The calibration was proved for determining quantitatively a hysteresis loop for the single magnetic dot with perpendicular magnetic anisotropy.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering