Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
The magnetic field dependence of the critical current of single YiBa2Cu307-8 grain boundary junctions has been measured as a function of temperature and orientation. A significant residual critical current is observed which increases with decreasing angle of misorientation at a given field and temperature. The data are in qualitative accord with a model in which the grain boundary comprises of a large number of micro-bridges in parallel. © 1993 IEEE
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
Frank Stem
C R C Critical Reviews in Solid State Sciences
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures