J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Paper
Low-temperature limit of screening length in semiconductors
Abstract
The conventional result for the screening length in a semiconductor with a discrete impurity level vanishes at absolute zero. When level broadening is included in a self-consistent way, a finite value is obtained. Results for the screening length and the root-mean-square potential fluctuation at absolute zero are given as functions of the degree of compensation. © 1974 The American Physical Society.