Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
A review is given of ion-beam-assisted (IBAD) metal film growth, focusing on ion beam techniques. Common experimental techniques including ion-beam-assisted evaporation and dual-ion-beam sputtering are described. Emphasis is placed on ion-bombardment-induced changes in film properties, including stress, resistivity, hardness, and magnetic properties. In addition, effects on film microstructure including grain size, texture, grain shape, and impurity incorporation are detailed. The themes emphasized in this review include (1) the complex relationship between changes in experimental deposition parameters and changes in film properties and microstructure, (2) current understanding of microstructure-property relations in ion-assisted films, and (3) important mechanisms for ion-assisted metal film growth. © 1992.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Kigook Song, Robert D. Miller, et al.
Macromolecules
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
T.N. Morgan
Semiconductor Science and Technology