I.F. Chang, M.W. Shafer
Applied Physics Letters
Large photoenhancement (by a factor of ≳100 in some devices) of electroluminescence in thin-film ZnS: Mn devices has been observed near and above the electroluminescence threshold effects when the devices were excited with the near-uv lines of an Ar+ laser. The intensity of the photoenhanced electroluminescence was found to have a sublinear dependence on the laser intensity, saturate, and then decrease with increased laser power.
I.F. Chang, M.W. Shafer
Applied Physics Letters
P. Thioulouse, I.F. Chang, et al.
JES
J.M. Brownlow, I.F. Chang
JES
I.F. Chang, S.S. Mitra
Advances in Physics