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Kronig-Penney-type calculations were used to evaluate the tunneling probability through a thin disordered dielectric film between two metallic electrodes. Our calculations indicate that the tunneling probability increases with increasing disorder. © 1972.
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
T.N. Morgan
Semiconductor Science and Technology
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Journal of Physics and Chemistry of Solids
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