J.E.E. Baglin, J. Dempsey, et al.
Journal of Electronic Materials
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
J.E.E. Baglin, J. Dempsey, et al.
Journal of Electronic Materials
F.M. D'Heurle, S. Petersson, et al.
Journal of Applied Physics
S. Petersson, J.E.E. Baglin, et al.
Journal of Applied Physics
M.H. Brodsky, P.A. Leary
Journal of Non-Crystalline Solids