M.H. Brodsky, D.P. Di Vincenzo
Journal of Non-Crystalline Solids
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
M.H. Brodsky, D.P. Di Vincenzo
Journal of Non-Crystalline Solids
H. Mell, M.H. Brodsky
Thin Solid Films
D. Henderson, M.H. Brodsky, et al.
Applied Physics Letters
M.H. Brodsky, G.H. Döhler
C R C Critical Reviews in Solid State Sciences