R.L. Anderson, J.E.E. Baglin, et al.
Applied Physics Letters
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
R.L. Anderson, J.E.E. Baglin, et al.
Applied Physics Letters
M.H. Brodsky, D.P. DiVincenzo
Physica B+C
F.M. D'Heurle, S. Petersson, et al.
Journal of Applied Physics
M.H. Brodsky, R.S. Title
Physical Review Letters