K. Weiser, M.H. Brodsky, et al.
Journal of Non-Crystalline Solids
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
K. Weiser, M.H. Brodsky, et al.
Journal of Non-Crystalline Solids
J.E.E. Baglin, F.M. D'Heurle, et al.
Nuclear Instruments and Methods
D.P. DiVincenzo, M.H. Brodsky
Journal of Non-Crystalline Solids
M.H. Brodsky, A. Lurio
Physical Review B