M.B. Ketchen, B.J. van der Hoeven, et al.
IEEE Electron Device Letters
Intra-pattern and Inter-pattern demagnetization fields cause the appearance of Non-Linear Transition Shift (NLTS) and Hard Transition Shift (HTS). Additional timing shifts at high frequency writing reinforce both intra-pattern and inter-pattern non-linearities. A model describing interaction of the timing and the density transition shifts for a dibit transition is proposed. Experimental results indicate strong interaction between adjacent transition in series and significant oscillations of transition shift. © 1998 IEEE.
M.B. Ketchen, B.J. van der Hoeven, et al.
IEEE Electron Device Letters
P.C. Arnett, D. Lam
IEEE Transactions on Magnetics
C.Michael Melas, P.C. Arnett
ICC 1990
P.C. Arnett, D.J. Herrell
IEEE Transactions on Magnetics