E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
A preliminary report of the a-b plane reflectivity of a Tl2Ba2CaCu2O8-x film (Tc ≅ 110K) is presented. The plasma edge occurs at ≅ 2000cm-1, which is quite unexpected because it implies an effective carrier density that is an order of magnitude less than obtained in other high temperature CuO superconductors. © 1989.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
R. Ghez, J.S. Lew
Journal of Crystal Growth
P. Alnot, D.J. Auerbach, et al.
Surface Science
Peter J. Price
Surface Science