Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
A preliminary report of the a-b plane reflectivity of a Tl2Ba2CaCu2O8-x film (Tc ≅ 110K) is presented. The plasma edge occurs at ≅ 2000cm-1, which is quite unexpected because it implies an effective carrier density that is an order of magnitude less than obtained in other high temperature CuO superconductors. © 1989.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
K.A. Chao
Physical Review B