Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Soft x-ray resonant magnetic diffraction at the Nd M edges was performed on a NdNi O3 epitaxial film to investigate the magnetic ordering of the Nd ions below the metal-insulator transition. A noncollinear magnetic structure induced by the Ni magnetic moments best describes the azimuthal angle dependency of the (1 2,0,1 2) reflection. This confirms the Ni spin structure observed with soft x-ray diffraction experiments performed at the Ni L edge, providing further evidence of charge disproportionation without orbital order below the metal-insulator transition in NdNi O3. © 2008 The American Physical Society.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
T. Schneider, E. Stoll
Physical Review B
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery