Conal E. Murray, Jean Jordan-Sweet, et al.
Applied Physics Letters
Paper
In situ synchrotron x-ray techniques for determining atomic structure at electrode/electrolyte interfaces
Abstract
We are presently undergoing a quiet revolution in the in situ determination of atomic scale structure at interfaces of interest to electrochemists.
Related
Bing K. Yen, Jan-Ulrich Thiele, et al.
IEEE Transactions on Magnetics
Michael F. Toney, Sean Brennan
Journal of Applied Physics
Michael F. Toney, C. Mathew Mate, et al.
IEEE Transactions on Magnetics