Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
An improved technique for bounding the mean-square error of signal parameter estimates is presented. The resulting bounds are independent of the bias and stronger than previously known bounds. © 1975, IEEE. All rights reserved.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Thomas R. Puzak, A. Hartstein, et al.
CF 2007
Robert E. Donovan
INTERSPEECH - Eurospeech 2001
Frank R. Libsch, S.C. Lien
IBM J. Res. Dev