Conference paper
Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
We consider an APX-hard variant (Δ-Max-ATSP) and an APX-hard relaxation (Max-3-DCC) of the classical traveling salesman problem. We present a frac(31, 40)-approximation algorithm for Δ-Max-ATSP and a frac(3, 4)-approximation algorithm for Max-3-DCC with polynomial running time. The results are obtained via a new way of applying techniques for computing undirected cycle covers to directed problems. © 2009 Elsevier B.V. All rights reserved.
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
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