Conference paper
Designing a testable System on a Chip
S.V. Kosonocky, A.A. Bright, et al.
VTS 1998
Rapid fluctuations of power supply values, or switching noise, can have a significant effect on VLSI circuit speed. This is shown by comparing circuit simulations with measurements of the critical path delay of a self-resetting SRAM. It is shown that including the measured high frequency noise in the circuit simulation leads to very accurate prediction of circuit speed.
S.V. Kosonocky, A.A. Bright, et al.
VTS 1998
Keith A. Jenkins, J.D. Cressler
IEDM 1988
Joachim N. Burghartz, John D. Cressler, et al.
IEEE Electron Device Letters
B.S. Wu, C.T. Chuang, et al.
IEEE Transactions on Electron Devices