Conference paper
RF and microwave building blocks in a standard BiCMOS technology
M. Soyuer, J.N. Burghartz, et al.
ISCAS 1996
Rapid fluctuations of power supply values, or switching noise, can have a significant effect on VLSI circuit speed. This is shown by comparing circuit simulations with measurements of the critical path delay of a self-resetting SRAM. It is shown that including the measured high frequency noise in the circuit simulation leads to very accurate prediction of circuit speed.
M. Soyuer, J.N. Burghartz, et al.
ISCAS 1996
G. Shahidi, J. Warnock, et al.
VLSI Technology 1992
J. Cai, K. Rim, et al.
IEDM 2004
C.T. Chuang, Ken Chin, et al.
IEEE Journal of Solid-State Circuits