J.N. Burghartz, D. Edelstein, et al.
IEDM 1996
Rapid fluctuations of power supply values, or switching noise, can have a significant effect on VLSI circuit speed. This is shown by comparing circuit simulations with measurements of the critical path delay of a self-resetting SRAM. It is shown that including the measured high frequency noise in the circuit simulation leads to very accurate prediction of circuit speed.
J.N. Burghartz, D. Edelstein, et al.
IEDM 1996
Keith A. Jenkins, J.P. Eckhardt
Electronics Letters
J.H. Comfort, P.F. Lu, et al.
VLSI Technology 1990
J.N. Burghartz, J.D. Cressler, et al.
Microelectronic Engineering