Conference paperExperimental and theoretical explanation for the orientation dependence gate-induced drain leakage in scaled MOSFETsP. Solomon, S.E. Laux, et al.DRC 2009
PaperEffect of forming gas anneal on Al-SiO2 internal photoemission characteristicsP. Solomon, D.J. DimariaJournal of Applied Physics
Conference paperAssembly technology for three dimensional integrated circuitsA. Topol, D.C. La Tulipe, et al.VMIC 2005
PaperMutual drag of two- and three-dimensional electron gases in heterostucturesB. Laikhtman, P. SolomonPhysical Review B