C.C.-H. Hsu, D.S. Wen, et al.
IEDM 1989
Paper
IIA-1 Generalized Scaling Theory and its Application to a 1/4 Micron Mosfet Design
Abstract
No abstract available.
Related
Conference paper
Scalability and biasing strategy for CMOS with active well bias
S. Huang, C. Wann, et al.
VLSI Technology 2001
M.R. Wordeman, A.M. Schweighart, et al.
VLSI Technology 1983
G. Baccarani, M.R. Wordeman
Solid-State Electronics