A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
We integrated an optical magnetometer into a conventional Kerr microscope, which gives us the possibility to measure hysteresis loops and observe magnetic domains simultaneously. An application is shown, the investigation of an exchange coupled Ni81Fe19/Ru/Ni81Fe19 sample in which the top ferromagnetic layer is wedge shaped. © 1995.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Hiroshi Ito, Reinhold Schwalm
JES
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering