A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
We present a scanning tunneling microscopy (STM) study of the mechanism of chemical vapor deposition (CVD) of Ge on Si(111)-7 × 7 from GeH4 and Ge2H6, and compare with results obtained by molecular beam epitaxy (MBE). We show that, depending on the growth conditions, the presence of hydrogen in CVD can produce two important effects: (a) the hydrogen can act as a site-selective "etchant", rendering substrate atoms labile, and (b) it can lead to the generation of new, metastable structures not produced by MBE deposition. Explanations for the above effects are proposed. © 1993.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
R. Ghez, J.S. Lew
Journal of Crystal Growth
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films