Heinz Koeppl, Marc Hafner, et al.
BMC Bioinformatics
No abstract available.
Heinz Koeppl, Marc Hafner, et al.
BMC Bioinformatics
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998