Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
A high surface concentration layer is essential for obtaining good ohmic contact on GaAs devices. Zn diffusion in GaAs using Zn3As2, ZnAs2, Zn3As2 + ZnAs2, and ZnAs2 + As as diffusion sources at low temperatures (600°-730'C) has been studied. The resulting surfaces were reproducible and undamaged, and the surface concentrations were in the 1020 cm-3 range. © 1976, The Electrochemical Society, Inc. All rights reserved.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
M.A. Lutz, R.M. Feenstra, et al.
Surface Science