Microscopy and Microanalysis

Paper

24 Jul 2003

High resolution spectrometer coupling to the sub-Å IBM STEM

Abstract

No abstract available.

Paper

Examination of flatband and threshold voltage tuning of HfO₂/TiN field effect transistors by dielectric cap layers

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Applied Physics Letters

Conference paper

Band-edge high-performance high-κ /metal gate n-MOSFETs using cap layers containing group IIA and IIIB elements with gate-first processing for 45 nm and beyond

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VLSI Technology 2006

Paper

Structure, chemistry and bonding at grain boundaries in Ni₃Al - I. The role of boron in ductilizing grain boundaries

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Acta Materialia

Paper

Surface plasmon scattering on flat surfaces at grazing incidence

P.E. Batson

Ultramicroscopy

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