J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
We examine the effect of Co-cluster morphology on giant magnetoresistance (MR) in phase-separated Co-Cu films. The Co clusters were characterized through grazing incidence, anomalous, small-angle x-ray scattering. With thermal annealing the Co cluster diameter increases from 21 to ∼250 with a concomitant drop from ∼35% to 1% in the 4.2 K MR. The MR scales approximately as the inverse cluster size. Comparison with theory indicates that interfacial spin-dependent electron scattering is the dominant scattering mechanism underlying giant MR for cluster diameters up to at least 250. © 1993 The American Physical Society.
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Mark W. Dowley
Solid State Communications