PaperEffects of surface and boundary diffusion on void growthM.D. Thouless, W. LinigerActa Metallurgica Et Materialia
PaperPlane-strain, buckling-driven delamination of thin films: Model experiments and mode-II fractureM.D. Thouless, J.W. Hutchinson, et al.Acta Metallurgica Et Materialia
PaperThe effect of residual stresses on adhesion measurementsM.D. Thouless, H.M. JensenJournal of Adhesion Science and Technology
