M. Hargrove, S.W. Crowder, et al.
IEDM 1998
We have studied the fractional quantization of the Hall resistance at 0.51 K in two-dimensional hole systems formed at p+ interfaces with mobilities as high as 8.0 × 104 cm2/Vs at 4 K. In addition to the Hall quantization for a fractional filling factor =23, we report for the first time the observation of an almost fully developed Hall plateau at =35 and the existence of weak but distinct structure in the magnetoresistance for =37 and 65. Similarly, magnetoresistance minima occurred at =53, 43, 23, 35, and 25. In contrast with two-dimensional electron systems, conspicuously absent was any magnetoresistance feature in the vicinity of =45. © 1984 The American Physical Society.
M. Hargrove, S.W. Crowder, et al.
IEDM 1998
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Michiel Sprik
Journal of Physics Condensed Matter