PaperChange-point models in industrial applicationsEmmanuel YashchinNonlinear Analysis, Theory, Methods and Applications
PaperEstimating the current mean of a process subject to abrupt changesEmmanuel YashchinTechnometrics
PaperGradient analysis of Markov-type control schemes and its applicationsEmmanuel YashchinCommun. Stat. Simul. Comput.
Conference paperMinimum void size and 3-parameter lognormal distribution for em failures in Cu interconnectsBaozhen Li, Cathryn Christiansen, et al.IRPS 2006
