S. Gaudet, C. Detavernier, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
In this paper, the effects of irradiation of Ge-doped FHD silica with 2 MeV Ar+ ions were optically characterized using an m-line technique based on grating couplers. An increase of refractive index as high as 1.2×10-2 was obtained, larger than the values normally reported for UV or electron-beam irradiation of the same material (typically of ≈10-3). Thermal annealing has been carried out and an activation energy of 0.36 eV for the recovery of the refractive index has been estimated, suggesting that a bond rearrangement mechanism could be responsible for the change in refractive index. © 2003 Elsevier Science B.V. All rights reserved.
S. Gaudet, C. Detavernier, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
J.E.E. Baglin, J.C. Davis, et al.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
E. Spiller, I. Hailer, et al.
Applied Optics
M. V. Ramana Murty, Harry A. Atwater, et al.
Applied Physics Letters