Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
We have recorded the extended x-ray-absorption fine structure (EXAFS) above the carbon K edge for diamond and highly oriented crystalline graphite using 250-800-eV synchrotron radiation. The spectra are used to test phase and amplitude transferability of the C-C EXAFS signal between the two bonding forms of carbon. We find excellent phaseshift transferability with errors in distances less than 0.01 AIS. Amplitude transferability is worse but better than 20%. Implications of our results for structural determinations of C-C bonds in molecules and solids are discussed. © 1988 The American Physical Society.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter
M. Hargrove, S.W. Crowder, et al.
IEDM 1998
K.A. Chao
Physical Review B