Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Paper
Experimental demonstration of the validity of accelerated radiation damage testing of x-ray mask materials
Abstract
No abstract available.
Related
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters