Microscopy and Microanalysis

Paper

15 Jul 2003

Experience with the IBM sub-angstrom STEM

Abstract

No abstract available.

Paper

Electronic structure in confined volumes using spatially resolved electron energy loss scattering

P.E. Batson

Materials Science and Engineering B

Paper

Atomic resolution EELS analysis of a misfit dislocation at a GeSi/Si interface

P.E. Batson

Physica B: Condensed Matter

Paper

Atomic and electronic structure of a dissociated 60° misfit dislocation in Ge_xSi(_1-x)

P.E. Batson

Physical Review Letters

Paper

Direct determination of local lattice polarity in crystals

K.A. Mkhoyan, P.E. Batson, et al.

Science

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