Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
We calculate the equilibrium shape of a silicon crystal at orientations near (001), both at T=0 and at elevated temperature. Comparison with recent experiments shows that several topographic features observed on Si directly reflect the equilibrium shape. In particular, our results resolve an apparent discrepancy between theory and experiment, regarding faceting between regions of single-layer and double-layer steps. © 1993 The American Physical Society.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020