Paperlow Temperature Silicon Epitaxy by Hot Wall Ultrahigh Vacuum/Low Pressure Chemical Vapor Deposition Techniques: Surface OptimizationB.S. Meyerson, E. Ganin, et al.JES
PaperCrystallographic texture change during abnormal grain growth in Cu-Co thin filmsJ.M.E. Harper, J. Gupta, et al.Applied Physics Letters
PaperStress-induced absorption and emission of point defects by grain boundariesA.H. King, D.A. SmithMetal Science
PaperObservation and interpretation of the atomic structure of a [Sgrave] = 19/[110] (331) tilt boundary in Au thin filmsW. Krakow, J.T. Wetzel, et al.Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
