J.C. Marinace
JES
A large enhancement of the parametrically generated backward-propagating elastic wave in Si: In is reported. The enhancement is observed when the nonlinear interaction between microwave electric and elastic fields occurs at the interface between the Si sample and the sputtered thin-film ZnO ultrasonic transducer. Phase and spectral information is presented. No satisfactory mechanism for the enhancement is known. © 1982 The American Physical Society.
J.C. Marinace
JES
K.A. Chao
Physical Review B
A. Gangulee, F.M. D'Heurle
Thin Solid Films
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering