Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Paper
Electron-energy-loss spectroscopy of layered systems
Abstract
A feature of electron-energy-loss spectroscopy (EELS) in layered materials is predicted. Contrary to the usual isotropic case, EELS becomes temperature dependent. This result, obtained by using thermodynamic Greens functions, arises from the unusual structure of the layer plasmon bands. © 1991 The American Physical Society.