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This paper discusses the engineering of electron-beam sys tems for the generation of micron and submicron lithography. Design objectives and options for the electron-beam column, X-Y workpiece stage, laser interferometer, pattern generator, software, and general engineering are the major topics. Copyright © 1983 by The Institute of Electrical and Electronics Engineers, Inc.v
Alfonso P. Cardenas, Larry F. Bowman, et al.
ACM Annual Conference 1975
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