M.A. Lutz, R.M. Feenstra, et al.
Surface Science
We investigate electrical transport and noise in semiconducting carbon nanotubes. By studying carbon nanotube devices with various diameters and contact metals, we show that the ON-currents of CNFETs are governed by the heights of the Schottky barriers at the metal/nanotube interfaces. The current fluctuations are dominated by 1 / f noise at low-frequencies and correlate with the number of transport carriers in the device regardless of contact metal. © 2006 Elsevier B.V. All rights reserved.
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
P.C. Pattnaik, D.M. Newns
Physical Review B
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT