Ellen J. Yoffa, David Adler
Physical Review B
No abstract available.
Ellen J. Yoffa, David Adler
Physical Review B
A. Reisman, M. Berkenblit, et al.
JES
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering