Lower-k SiCOH integration for 65 nm ground rules
T. Nogami, S. Lane, et al.
VMIC 2005
We investigate the effect of two different surface treatments on shallow nitrogen-vacancy (NV) centers in diamond. Short duration oxygen plasma exposure is found to damage near-surface NV centers, resulting in their disappearance in fluorescence images. Subsequent annealing creates large numbers of new NV centers, attributed to plasma-induced vacancy creation. By tracking individual NV centers during thermal oxidation, we show that oxidation at 550 °C results in modest improvement of spin coherence. Higher temperature oxidations correlate with gradual decline in spin coherence and eventual instability of NV centers before ultimate disappearance. This is indicative of a reduction of the NV-to-surface distance due to oxidative etching. Thermal oxidation can offer controlled access to near-surface NV spins at the nanometer scale, an important requirement for many applications of NV-based nanomagnetometry. © 2014 AIP Publishing LLC.
T. Nogami, S. Lane, et al.
VMIC 2005
P. Grütter, D. Rugar, et al.
Ultramicroscopy
D. Rugar, H.J. Mamin, et al.
Nature Nanotechnology
J.E. Stern, B.D. Terris, et al.
Applied Physics Letters