I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Smeared transitions into low-T domain states are evidenced by linear birefringence measured on Srl-xCaxTiO3 at all concentrations, ˂0.002˂x˂0.058. Sharp E vs T peaks, as observed for x 0.016, may be explained by domains having nearly sample size. The local disorder due t o the Ca2+-induced random fields may pa rtially be removed by a uniform external electric field. © 1988, Taylor & Francis Group, LLC. All rights reserved.
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
P.C. Pattnaik, D.M. Newns
Physical Review B
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics