PaperElectronic structure of localized Si dangling-bond defects by tunneling spectroscopyR.J. Hamers, J.E. DemuthPhysical Review Letters
PaperUltrafast time resolution in scanned probe microscopiesR.J. Hamers, David G. CahillApplied Physics Letters
PaperInitial stage deposition of Ag on the Si (100)2x1 surface studied by scanning tunneling microscopyT. Hashizume, R.J. Hamers, et al.Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperCompetition between direct-inelastic and trapping desorption channels in the scattering of NO (v=0, J) from Ir(111) aR.J. Hamers, P.L. Houston, et al.The Journal of Chemical Physics
