Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
The IV characteristics of thin (250-4000 Å) YBa2Cu3O7-δ films show a crossover from the critical scaling behavior of the intrinsic three-dimensional (3D) transition, observed at high currents, to an ohmic resistance at low currents associated with a two-dimensional phase. This crossover is observed near the 3D phase transition from normal to vortex-glass phase in a high magnetic field, as well as for H = 0 near the transition into the Meissner phase. The crossover occurs when the growth of the 3D correlation length, ξθ(T - Tc,3D)-v, is limited by the film thickness. © 1991.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications
R.W. Gammon, E. Courtens, et al.
Physical Review B
R. Ghez, J.S. Lew
Journal of Crystal Growth