Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Dilute solution properties of polystyrene and poly(α‐methylstyrene) in toluene have been measured using several of the commercially available instruments for intensity light scattering. Results are compared among the instruments used and with literature values. Relative advantages and disadvantages of the instruments are discussed. Copyright © 1991 John Wiley & Sons, Inc.
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
Peter J. Price
Surface Science