G. Ottaviani, K.N. Tu, et al.
Applied Physics Letters
Diffusion of Ag110m radioactive tracer has been measured in amorphous Pd-19-at.%-Si specimens characterized by a Seeman-Bohlin x-ray diffractometer. The diffusion parameters in this metallic amorphous phase have been found to have a regime distinctly different from liquid and crystalline phases. © 1975 The American Physical Society.
G. Ottaviani, K.N. Tu, et al.
Applied Physics Letters
I. Ohdomari, K.N. Tu, et al.
Applied Physics Letters
F. Faupel, D. Gupta, et al.
Applied Physics Letters
D. Gupta, K.W. Asai
Thin Solid Films